Jingyong Zeng, Hang Lei, Haibo Pu. Evaluating the Effectiveness of Random and Partition Testing by Delivered Reliability. In Shuvra S. Bhattacharyya, Xingshe Zhou, Bing Guo, Zili Shao, Xiangke Liao, editors, International Conference on Embedded Software and Systems, ICESS '08, Chengdu, Sichuan, China, July 29-31, 2008. pages 496-502, IEEE, 2008. [doi]
Abstract is missing.