A Novel Hierarchical Tree-DCNN Structure for Unbalanced Data Diagnosis in Microelectronic Manufacturing Process

Yong Zeng, Yanfang Mei, Yueming Hu 0002, Zhengguo Sheng. A Novel Hierarchical Tree-DCNN Structure for Unbalanced Data Diagnosis in Microelectronic Manufacturing Process. IEEE T. Instrumentation and Measurement, 73:1-11, 2024. [doi]

Abstract

Abstract is missing.