Danfeng Zhai, Peizhe Li, Jiushan Zhang, Chixiao Chen, Fan Ye 0001, Junyan Ren. Additive Neural Network Based Static and Dynamic Distortion Modeling for Prior-Knowledge-Free Nyquist ADC Characterization. In 64th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2021, Lansing, MI, USA, August 9-11, 2021. pages 292-296, IEEE, 2021. [doi]
Abstract is missing.