Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors

Xuepeng Zhan, Jiezhi Chen, Zhigang Ji. Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors. Science in China Series F: Information Sciences, 65(8):1-2, 2022. [doi]

Authors

Xuepeng Zhan

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Jiezhi Chen

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Zhigang Ji

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