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A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA

Qiutao Zhang, Sarah Azimi, Germano La Vaccara, Luca Sterpone, Boyang Du. A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA. Microelectronics Reliability, 76:58-63, 2017. [doi]

Authors

Qiutao Zhang

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Sarah Azimi

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Germano La Vaccara

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Luca Sterpone

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Boyang Du

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