A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA

Qiutao Zhang, Sarah Azimi, Germano La Vaccara, Luca Sterpone, Boyang Du. A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA. Microelectronics Reliability, 76:58-63, 2017. [doi]

Abstract

Abstract is missing.