Cross-Entropy: A New Metric for Software Defect Prediction - researchr publication authors

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Xian Zhang, Kerong Ben, Jie Zeng. Cross-Entropy: A New Metric for Software Defect Prediction. In 2018 IEEE International Conference on Software Quality, Reliability and Security, QRS 2018, Lisbon, Portugal, July 16-20, 2018. pages 111-122, IEEE, 2018. [doi]

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