Xian Zhang, Kerong Ben, Jie Zeng. Cross-Entropy: A New Metric for Software Defect Prediction. In 2018 IEEE International Conference on Software Quality, Reliability and Security, QRS 2018, Lisbon, Portugal, July 16-20, 2018. pages 111-122, IEEE, 2018. [doi]
@inproceedings{ZhangBZ18-1,
title = {Cross-Entropy: A New Metric for Software Defect Prediction},
author = {Xian Zhang and Kerong Ben and Jie Zeng},
year = {2018},
doi = {10.1109/QRS.2018.00025},
url = {https://doi.org/10.1109/QRS.2018.00025},
researchr = {https://researchr.org/publication/ZhangBZ18-1},
cites = {0},
citedby = {0},
pages = {111-122},
booktitle = {2018 IEEE International Conference on Software Quality, Reliability and Security, QRS 2018, Lisbon, Portugal, July 16-20, 2018},
publisher = {IEEE},
isbn = {978-1-5386-7757-5},
}