The following publications are possibly variants of this publication:
- Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment TestingShanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi. tim, 56(3):1094-1100, 2007. [doi]
- Partitioning Techniques for Built-In Self-Test DesignChien-In Henry Chen. vlsi, 2(3):185-198, 1994. [doi]
- Automated synthesis of pseudo-exhaustive test generator in VLSI BIST designChien-In Henry Chen, Joel T. Yuen. tvlsi, 2(3):273-291, 1994. [doi]