Gongjie Zhang, Kaiwen Cui, Tzu-Yi Hung, Shijian Lu. Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection. In IEEE Winter Conference on Applications of Computer Vision, WACV 2021, Waikoloa, HI, USA, January 3-8, 2021. pages 2523-2533, IEEE, 2021. [doi]
Abstract is missing.