Mu Zhang, Chien-Ying Chen, Bin-Chou Kao, Yassine Qamsane, Yuru Shao, Yikai Lin, Elaine Shi, Sibin Mohan, Kira Barton, James R. Moyne, Z. Morley Mao. Towards Automated Safety Vetting of PLC Code in Real-World Plants. In 2019 IEEE Symposium on Security and Privacy, SP 2019, San Francisco, CA, USA, May 19-23, 2019. pages 522-538, IEEE, 2019. [doi]
Abstract is missing.