Tianci Zhang, Jinglong Chen, Tongyang Pan, Zitong Zhou. Towards Intelligent Fault Diagnosis under Small Sample Condition via A Signals Augmented Semi-supervised Learning Framework. In 18th IEEE International Conference on Industrial Informatics, INDIN 2020, Warwick, United Kingdom, July 20-23, 2020. pages 669-672, IEEE, 2020. [doi]
Abstract is missing.