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A cortical potential imaging study from simultaneous extra- and intracranial electrical recordings by means of the finite element method

Yingchun Zhang, Lei Ding, Wim van Drongelen, Kurt E. Hecox, David M. Frim, Bin He 0002. A cortical potential imaging study from simultaneous extra- and intracranial electrical recordings by means of the finite element method. NeuroImage, 31(4):1513-1524, 2006. [doi]

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