Layer Embedding Analysis in Convolutional Neural Networks for Improved Probability Calibration and Classification

Fan Zhang 0009, Nicha C. Dvornek, Junlin Yang, Julius Chapiro, Jim Duncan 0001. Layer Embedding Analysis in Convolutional Neural Networks for Improved Probability Calibration and Classification. IEEE Trans. Med. Imaging, 39(11):3331-3342, 2020. [doi]

Abstract

Abstract is missing.