Guoyan Zhang, Ronan Farrell. Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. In Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubatova, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jiri Bucek, editors, Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. pages 89-90, IEEE Computer Society, 2006.
@inproceedings{ZhangF06:15,
title = {Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits},
author = {Guoyan Zhang and Ronan Farrell},
year = {2006},
tags = {testing},
researchr = {https://researchr.org/publication/ZhangF06%3A15},
cites = {0},
citedby = {0},
pages = {89-90},
booktitle = {Proceedings of the 9th IEEE Workshop on Design \& Diagnostics of Electronic Circuits \& Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006},
editor = {Matteo Sonza Reorda and Ondrej Novák and Bernd Straube and Hana Kubatova and Zdenek Kotásek and Pavel Kubalík and Raimund Ubar and Jiri Bucek},
publisher = {IEEE Computer Society},
isbn = {1-4244-0185-2},
}