Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs

Yamin Zhang, Shiwei Feng, Hui Zhu, Jianwei Zhang, Bing Deng. Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs. Microelectronics Reliability, 53(5):694-700, 2013. [doi]

Abstract

Abstract is missing.