Jizhe Zhang, Sandeep Gupta. SRAM Array Yield Estimation under Spatially-Correlated Process Variation. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 149-155, IEEE Computer Society, 2014. [doi]
@inproceedings{ZhangG14-10,
title = {SRAM Array Yield Estimation under Spatially-Correlated Process Variation},
author = {Jizhe Zhang and Sandeep Gupta},
year = {2014},
doi = {10.1109/ATS.2014.43},
url = {http://dx.doi.org/10.1109/ATS.2014.43},
researchr = {https://researchr.org/publication/ZhangG14-10},
cites = {0},
citedby = {0},
pages = {149-155},
booktitle = {23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6030-9},
}