Evolutionary generation of test data for path coverage with faults detection

Yan Zhang, Dunwei Gong, Yongjin Luo. Evolutionary generation of test data for path coverage with faults detection. In Yongsheng Ding, Haiying Wang, Ning Xiong, Kuangrong Hao, Lipo Wang, editors, Seventh International Conference on Natural Computation, ICNC 2011, Shanghai, China, 26-28 July, 2011. pages 2086-2090, IEEE, 2011. [doi]

Abstract

Abstract is missing.