Practitioners' Challenges Panel: The Challenges and Opportunities of Forensic Investigation over Large Data Sets: Timeliness vs Precision vs Comprehensiveness

Nan Zhang 0004, Yong Guan, Michael Martin Losavio, Peter J. Vasquez, Robert M. Nissen, Edward B. Talbot, Vassil Roussev. Practitioners' Challenges Panel: The Challenges and Opportunities of Forensic Investigation over Large Data Sets: Timeliness vs Precision vs Comprehensiveness. In Robert F. Erbacher, Roy H. Campbell, Yong Guan, editors, 2011 IEEE Sixth International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011, Oakland, CA, USA, May 26, 2011. pages 1-3, IEEE, 2011. [doi]

@inproceedings{ZhangGLVNTR11,
  title = {Practitioners' Challenges Panel: The Challenges and Opportunities of Forensic Investigation over Large Data Sets: Timeliness vs Precision vs Comprehensiveness},
  author = {Nan Zhang 0004 and Yong Guan and Michael Martin Losavio and Peter J. Vasquez and Robert M. Nissen and Edward B. Talbot and Vassil Roussev},
  year = {2011},
  doi = {10.1109/SADFE.2011.13},
  url = {http://dx.doi.org/10.1109/SADFE.2011.13},
  researchr = {https://researchr.org/publication/ZhangGLVNTR11},
  cites = {0},
  citedby = {0},
  pages = {1-3},
  booktitle = {2011 IEEE Sixth International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011, Oakland, CA, USA, May 26, 2011},
  editor = {Robert F. Erbacher and Roy H. Campbell and Yong Guan},
  publisher = {IEEE},
  isbn = {978-1-4673-1242-4},
}