2011 IEEE Sixth International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011, Oakland, CA, USA, May 26, 2011

Robert F. Erbacher, Roy H. Campbell, Yong Guan, editors, 2011 IEEE Sixth International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011, Oakland, CA, USA, May 26, 2011. IEEE, 2011. [doi]

Conference: sadfe2011

Abstract

Abstract is missing.

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