Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise - researchr publication authors

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Tengteng Zhang, Yukun Gao, D. M. H. Walker. Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise. In IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. pages 61-64, IEEE, 2014. [doi]

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