Tengteng Zhang, Yukun Gao, D. M. H. Walker. Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise. In IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. pages 61-64, IEEE, 2014. [doi]
@inproceedings{ZhangGW14-0,
title = {Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise},
author = {Tengteng Zhang and Yukun Gao and D. M. H. Walker},
year = {2014},
doi = {10.1109/NATW.2014.21},
url = {http://dx.doi.org/10.1109/NATW.2014.21},
researchr = {https://researchr.org/publication/ZhangGW14-0},
cites = {0},
citedby = {0},
pages = {61-64},
booktitle = {IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014},
publisher = {IEEE},
}