Wenjuan Zhang, Yajun Ha. A Hilbert curve-based delay fault characterization method for FPGAs. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 2059-2062, IEEE, 2011. [doi]
@inproceedings{ZhangH11-2,
title = {A Hilbert curve-based delay fault characterization method for FPGAs},
author = {Wenjuan Zhang and Yajun Ha},
year = {2011},
doi = {10.1109/ISCAS.2011.5938002},
url = {http://dx.doi.org/10.1109/ISCAS.2011.5938002},
tags = {rule-based},
researchr = {https://researchr.org/publication/ZhangH11-2},
cites = {0},
citedby = {0},
pages = {2059-2062},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil},
publisher = {IEEE},
}