Resolution improvement of acoustic microimaging by continuous wavelet transform for semiconductor inspection

Guang-Ming Zhang, David M. Harvey, Derek R. Braden. Resolution improvement of acoustic microimaging by continuous wavelet transform for semiconductor inspection. Microelectronics Reliability, 46(5-6):811-821, 2006. [doi]

Authors

Guang-Ming Zhang

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David M. Harvey

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Derek R. Braden

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