Guang-Ming Zhang, David M. Harvey, Derek R. Braden. Resolution improvement of acoustic microimaging by continuous wavelet transform for semiconductor inspection. Microelectronics Reliability, 46(5-6):811-821, 2006. [doi]
@article{ZhangHB06,
title = {Resolution improvement of acoustic microimaging by continuous wavelet transform for semiconductor inspection},
author = {Guang-Ming Zhang and David M. Harvey and Derek R. Braden},
year = {2006},
doi = {10.1016/j.microrel.2005.07.008},
url = {http://dx.doi.org/10.1016/j.microrel.2005.07.008},
researchr = {https://researchr.org/publication/ZhangHB06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {5-6},
pages = {811-821},
}