A Simulation Analysis of Reliability in Erasure-Coded Data Centers

Mi Zhang, Shujie Han, Patrick P. C. Lee. A Simulation Analysis of Reliability in Erasure-Coded Data Centers. In 36th IEEE Symposium on Reliable Distributed Systems, SRDS 2017, Hong Kong, Hong Kong, September 26-29, 2017. pages 144-153, IEEE Computer Society, 2017. [doi]

Abstract

Abstract is missing.