Design and Analysis of Testable Mutual Exclusion Elements - researchr publication authors

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Yang Zhang, Leandro S. Heck, Matheus T. Moreira, David Zar, Melvin Breuer, Ney Laert Vilar Calazans, Peter A. Beerel. Design and Analysis of Testable Mutual Exclusion Elements. In 21st IEEE International Symposium on Asynchronous Circuits and Systems, ASYNC 2015, Mountain View, CA, USA, May 4-6, 2015. pages 124-131, IEEE, 2015. [doi]

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Yang Zhang

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