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Yang Zhang, Leandro S. Heck, Matheus T. Moreira, David Zar, Melvin A. Breuer, Ney Laert Vilar Calazans, Peter A. Beerel. Testable MUTEX Design. IEEE Trans. on Circuits and Systems, 63-I(8):1188-1199, 2016. [doi]
Abstract is missing.