Testable MUTEX Design

Yang Zhang, Leandro S. Heck, Matheus T. Moreira, David Zar, Melvin A. Breuer, Ney Laert Vilar Calazans, Peter A. Beerel. Testable MUTEX Design. IEEE Trans. on Circuits and Systems, 63-I(8):1188-1199, 2016. [doi]

Abstract

Abstract is missing.