Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak. Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
@inproceedings{ZhangHSGASWD16,
title = {Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture},
author = {Fanchen Zhang and Daphne Hwong and Yi Sun and Allison Garcia and Soha Alhelaly and Geoff Shofner and LeRoy Winemberg and Jennifer Dworak},
year = {2016},
doi = {10.1109/TEST.2016.7805828},
url = {http://dx.doi.org/10.1109/TEST.2016.7805828},
researchr = {https://researchr.org/publication/ZhangHSGASWD16},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}