Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks

Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu. Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 456-461, IEEE Computer Society, 2009. [doi]

@inproceedings{ZhangHYX09,
  title = {Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks},
  author = {Yubin Zhang and Lin Huang and Feng Yuan and Qiang Xu},
  year = {2009},
  doi = {10.1109/ATS.2009.69},
  url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.69},
  tags = {testing, source-to-source, open-source},
  researchr = {https://researchr.org/publication/ZhangHYX09},
  cites = {0},
  citedby = {0},
  pages = {456-461},
  booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-3864-8},
}