Jingyang Zhang, Nathan Inkawhich, Randolph Linderman, Yiran Chen 0001, Hai Li 0001. Mixture Outlier Exposure: Towards Out-of-Distribution Detection in Fine-grained Environments. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2023, Waikoloa, HI, USA, January 2-7, 2023. pages 5520-5529, IEEE, 2023. [doi]
Abstract is missing.