Robust Locality-Constrained Label Consistent K-SVD by Joint Sparse Embedding

Zhao Zhang, Weiming Jiang, Sheng Li 0001, Jie Qin, Guangcan Liu, Shuicheng Yan. Robust Locality-Constrained Label Consistent K-SVD by Joint Sparse Embedding. In 24th International Conference on Pattern Recognition, ICPR 2018, Beijing, China, August 20-24, 2018. pages 1664-1669, IEEE Computer Society, 2018. [doi]

Abstract

Abstract is missing.