Voltage step stress: a technique for reducing test time of device ageing

J. F. Zhang, Z. Ji, M. Duan, W. Zhang, C. Z. Zhao. Voltage step stress: a technique for reducing test time of device ageing. In International Conference on IC Design and Technology, ICICDT 2019, Suzhou, China, June 17-19, 2019. pages 1-4, IEEE, 2019. [doi]

Abstract

Abstract is missing.