Jiangwei Zhang, Donald Kline Jr., Liang Fang, Rami G. Melhem, Alex K. Jones. Yielding optimized dependability assurance through bit inversion. Integration, 64:105-113, 2019. [doi]
@article{ZhangKFMJ19,
title = {Yielding optimized dependability assurance through bit inversion},
author = {Jiangwei Zhang and Donald Kline Jr. and Liang Fang and Rami G. Melhem and Alex K. Jones},
year = {2019},
doi = {10.1016/j.vlsi.2018.09.002},
url = {https://doi.org/10.1016/j.vlsi.2018.09.002},
researchr = {https://researchr.org/publication/ZhangKFMJ19},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {64},
pages = {105-113},
}