An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application

Ji Zhang, Keong W. Kam, Jin Min, Victor V. Khilkevich, David Pommerenke, Jun Fan. An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application. IEEE T. Instrumentation and Measurement, 62(3):648-658, 2013. [doi]

Abstract

Abstract is missing.