Xiaowen Zhang, Xiaoling Lin, Rui Gao. The study of parameters variation of nMOSFET affected by the HCI. In Fan Ye, Ting-Ao Tang, editors, 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.