Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits - researchr publication authors

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Wangyang Zhang, Xin Li, Frank Liu, Emrah Acar, Rob A. Rutenbar, Ronald D. Blanton. Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(12):1814-1827, 2011. [doi]

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