PatentLine: analyzing technology evolution on multi-view patent graphs

Longhui Zhang, Lei Li, Tao Li, Qi Zhang. PatentLine: analyzing technology evolution on multi-view patent graphs. In Shlomo Geva, Andrew Trotman, Peter Bruza, Charles L. A. Clarke, Kalervo Järvelin, editors, The 37th International ACM SIGIR Conference on Research and Development in Information Retrieval, SIGIR '14, Gold Coast , QLD, Australia - July 06 - 11, 2014. pages 1095-1098, ACM, 2014. [doi]

Abstract

Abstract is missing.