A Patent Data Meta-Path based Technological Risk Prediction Method

Jiamin Zhang, Weidong Liu, Yuling Yang, Fuming Ye. A Patent Data Meta-Path based Technological Risk Prediction Method. In Shi-Kuo Chang, editor, The 36th International Conference on Software Engineering and Knowledge Engineering, SEKE 2024, KSIR Virtual Conference Center, USA, October 26 - November 3, 2024. pages 1-6, KSI Research Inc., 2024. [doi]

Abstract

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