An assessment of RTN-induced threshold voltage jitter - researchr publication authors

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Jianfu Zhang 0001, Azrif Manut, Rui Gao, Mehzabeen Mehedi, Zhigang Ji, Weidong Zhang 0002, John Marsland. An assessment of RTN-induced threshold voltage jitter. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]

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