Fatigue life and resistance analysis of COG assemblies under hygrothermal aging

Wenguo Zhang, Jian-Hua Ma, Li-Lan Gao, Zhe Zhang, Hong Gao. Fatigue life and resistance analysis of COG assemblies under hygrothermal aging. Microelectronics Reliability, 55(3-4):623-629, 2015. [doi]

Abstract

Abstract is missing.