Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation - researchr publication authors

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Bin Zhang, Michael Orshansky. Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 774-779, IEEE Computer Society, 2008. [doi]

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