Ying Zhang, Zebo Peng, Jianhui Jiang, Huawei Li, Masahiro Fujita. Temperature-aware software-based self-testing for delay faults. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 423-428, ACM, 2015. [doi]
Abstract is missing.