A fully automated large-scale addressable test chip design with high reliability - researchr publication authors

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Bo Zhang, Weiwei Pan, Yongjun Zheng, Zheng Shi, Xiaolang Yan. A fully automated large-scale addressable test chip design with high reliability. In 20th European Conference on Circuit Theory and Design, ECCTD 2011, Linkoping, Sweden, Aug. 29-31, 2011. pages 61-64, IEEE, 2011. [doi]

This author has not been identified. Look up 'Bo Zhang' in GoogleThis author has not been identified. Look up 'Weiwei Pan' in GoogleThis author has not been identified. Look up 'Yongjun Zheng' in GoogleThis author has not been identified. Look up 'Zheng Shi' in GoogleThis author has not been identified. Look up 'Xiaolang Yan' in Google

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