Huaizhong Zhang, E. Patricia Rodriguez, Philip J. Morrow, Sally I. McClean, Kurt Saetzler. MCMC-Based Algorithm to Adjust Scale Bias in Large Series of Electron Microscopical Ultrathin Sections. In Xiaoyi Jiang, Nicolai Petkov, editors, Computer Analysis of Images and Patterns, 13th International Conference, CAIP 2009, Münster, Germany, September 2-4, 2009. Proceedings. Volume 5702 of Lecture Notes in Computer Science, pages 557-564, Springer, 2009. [doi]
Abstract is missing.