Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattacharya. Efficient Test Compaction for Pseudo-Random Testing. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 337-342, IEEE Computer Society, 2005. [doi]
@inproceedings{ZhangSB05:1,
title = {Efficient Test Compaction for Pseudo-Random Testing},
author = {Sheng Zhang and Sharad C. Seth and Bhargab B. Bhattacharya},
year = {2005},
doi = {10.1109/ATS.2005.55},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.55},
tags = {testing, C++, random testing},
researchr = {https://researchr.org/publication/ZhangSB05%3A1},
cites = {0},
citedby = {0},
pages = {337-342},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}