Xuemei Zhang, D. Amnon Silverstein, Joyce E. Farrell, Brian A. Wandell. Color image quality metric S-CIELAB and its application on halftone texture visibility. In Proceedings IEEE COMPCON 97, San Jose, California, USA, February 23-26, 1997, Digest of Papers. pages 44-48, IEEE Computer Society, 1997. [doi]
Abstract is missing.