Xin Zhang, Jafar Saniie, Alexander Heifetz. Neural Learning Based Blind Source Separation for Detection of Material Defects in Pulsed Thermography Images. In 2020 IEEE International Conference on Electro Information Technology, EIT 2020, Chicago, IL, USA, July 31 - August 1, 2020. pages 112-116, IEEE, 2020. [doi]
Abstract is missing.