Li Zhang, Shitian Shen, Lingxiao Li, Han Wang, Xueying Li, Jun Lang. Jointly Multi-Similarity Loss for Deep Metric Learning. In James Bailey 0001, Pauli Miettinen, Yun Sing Koh, Dacheng Tao, Xindong Wu 0001, editors, IEEE International Conference on Data Mining, ICDM 2021, Auckland, New Zealand, December 7-10, 2021. pages 1469-1474, IEEE, 2021. [doi]
Abstract is missing.