Combined Anomaly Aware Weakly Supervised Lightweight Model for Surface Defect Inspection

Zhe Zhang, Zhenqiao Shang, Xin Wang, Jie Ma. Combined Anomaly Aware Weakly Supervised Lightweight Model for Surface Defect Inspection. IEEE Trans. Industrial Informatics, 20(4):6652-6663, April 2024. [doi]

Abstract

Abstract is missing.